Theory of an X-Ray Interferometer in the Form of an Array of Planar Compound Refractive Lenses

摘要

The results of theoretical analysis of the interference pattern created by an X-ray multilens interferometer in the case of an arbitrary number of planar compound refractive lenses are presented. The full widths at half maximum of the resonance peaks in the transverse and longitudinal directions relative to the direction of synchrotron radiation are calculated at distances corresponding to the fractional Talbot effect. A relation between the widths is shown to exist that is very close to the width relation in the case of focusing by a single lens. A difference between the fractional and full Talbot effects is discussed, and the necessary conditions for the transverse and longitudinal coherence of radiation are analyzed, the satisfaction of which guarantees that undistorted interference peaks will be observed experimentally.