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The influence of monovalent cations on the stability of electrochemically formed nickel fluoride films

机译:单价阳离子对电化学形成的氟化镍薄膜稳定性的影响

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The stability of electrochemically formed NiF_2 film in 1.0 M perchloric acid containing monovalent fluorides namely, NH_4F, HF, NaF, KF and LiF, is investigated using cyclic voltammetry, chronoamperometry, atomic absorption spectroscopy and scanning electron microscopy. In addition to direct dissolution of nickel and dissolution through the oxide layer, a new mode of dissolution of NiF_2 film as NiF~-_3 and NiF~(2-)_4 through complex formation is proposed. This process is significantly influenced by the alkali metal fluorides. On a comparative basis the stability of NiF_2 decreases in the order NH_4F>HF>KF>LiF.
机译:采用循环伏安法,计时安培法,原子吸收光谱法和扫描电子显微镜研究了电化学形成的NiF_2膜在1.0M含一价氟化物高氯酸(NH_4F,HF,NaF,KF和LiF)中的稳定性。除了直接溶解镍和通过氧化物层溶解外,还提出了通过复合物形成NiF_2薄膜的新溶解方式,如NiF〜-_3和NiF〜(2-)_ 4。该过程受碱金属氟化物的影响很大。在比较的基础上,NiF_2的稳定性以NH_4F> HF> KF> LiF的顺序降低。

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