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首页> 外文期刊>Journal of Radiation Research: Official Organ of the Japan Radiation Research Society >Radiation-generated short DNA fragments may perturb non-homologous end-joining and induce genomic instability
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Radiation-generated short DNA fragments may perturb non-homologous end-joining and induce genomic instability

机译:辐射产生的短DNA片段可能会干扰非同源末端连接并诱导基因组不稳定

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摘要

Cells exposed to densely ionizing radiation (high-LET) experience more severe biological damage than do cells exposed to sparsely ionizing radiation (low-LET). The prevailing hypothesis is that high-LET radiations induce DNA double strand-breaks (DSB) that are more complex and clustered, and are thereby more challenging to repair. Here, we present experimental data obtained by atomic force microscopy imaging, DNA-dependent protein kinase (DNA-PK) activity determination, DNA ligation assays, and genomic studies to suggest that short DNA fragments are important products of radiation-induced DNA lesions, and that the lengths of DNA fragments may be significant in the cellular responses to ionizing radiation. We propose the presence of a subset of short DNA fragments that may affect cell survival and genetic stability following exposure to ionizing radiation, and that the enhanced biological effects of high-LET radiation may be explained, in part, by the production of increased quantities of short DNA fragments.
机译:暴露于高密度电离辐射(高LET)的细胞比暴露于稀疏电离辐射(低LET)的细胞遭受更严重的生物学损伤。普遍的假设是,高LET辐射会导致DNA双链断裂(DSB)更加复杂和聚集,因此修复起来更具挑战性。在这里,我们介绍通过原子力显微镜成像,DNA依赖性蛋白激酶(DNA-PK)活性测定,DNA连接测定和基因组研究获得的实验数据,以表明短的DNA片段是辐射诱导的DNA损伤的重要产物,并且DNA片段的长度在细胞对电离辐射的反应中可能很重要。我们建议存在一个短的DNA片段子集,该子集在暴露于电离辐射后可能会影响细胞存活和遗传稳定性,并且高LET辐射的增强的生物学效应可能部分地由产生更多的短的DNA片段。

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