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Log-Odds Rate and Monotone Log-Odds Rate Distributions

机译:对数几率和单调对数率分布

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Since the 1960's,reliability models for time to failure based on monotone failure rate models have become important models of faiure time for reliability practitioners.Bounds for monotone increasing failure rates(IFR) have been developed and are especially useful for bounding the hazard of aging.Recently,however,it appears that the IFR model as a model of aging may be too stringent for some modern components.This supposition is confirmed by the widespread use of the log normal model to descibe time to failure.This paper introduces a new time-to-failure model based on the log-odds-rate(LOR) which is comparable to the model based on the failure rate.It is shown that failure-time distributions can be characterized by LOR and that the increasing LOR(ILOR) model in terms of log time(Ln(t))is less stringent than the IFR model for aging.It is shown that the logistic distribution has the property of a constant LOR and that the log-logistic distribution has the property of a constant LOR with respect to Ln(t).Some;;properties of ILOR distribution are presented and bounds based on the relationship to the log-logistic distribution are provided for distributions which are ILOR with respect to Ln(t).Examples of the use of the bounds are also presented,and examples of the comparisons of the ILOR bounds with the IFR bounds are made
机译:自1960年代以来,基于单调故障率模型的失效时间可靠性模型已成为可靠性从业人员失效时间的重要模型。单调提高故障率(IFR)的界限已被开发出来,对于限制老化的危害尤其有用。但是,最近看来,IFR模型作为一种老化模型对于某些现代组件而言可能过于严格。这一假设已被对数正态模型广泛用于确定失效时间的事实所证实。基于log-odds-rate(LOR)的失效模型可与基于故障率的模型进行比较。结果表明,失效时间分布可以用LOR来表征,而递增的LOR(ILOR)模型可以用来描述失效时间分布。对数时间项(Ln(t))的条件不如用于老化的IFR模型严格,它表明对数分布具有常数LOR的性质,对数逻辑分布具有常数LOR且具有r考虑到Ln(t).ILOR分布的一些特性被提出,并基于与对数逻辑分布的关系提供了关于ILn相对于Ln(t)的分布范围的界限。还介绍了ILOR边界与IFR边界的比较示例

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