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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Preparation and characterization of hydrogenated diamond-like carbon films in a dual DC-RF plasma system
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Preparation and characterization of hydrogenated diamond-like carbon films in a dual DC-RF plasma system

机译:双DC-RF等离子体系统中氢化类金刚石碳膜的制备与表征

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摘要

A dual direct current and radio frequency (DC-RF) plasma system was used to deposit hydrogenated diamond-like carbon (DLC) films from methane plasma. It has the advantages of separately controlling ion density and ion energy by RF power and DC bias, respectively, over conventional simply capacitive-coupled radio frequency plasma enhanced chemical vapour deposition system. Thus, the hydrogenated DLC films were obtained at different RF powers and DC biases, using CH4 plus Ar as the feedstock. The effects of RF power and DC bias on the structured and properties of the films were investigated by means of Fourier transformation infrared spectroscopy, Raman spectroscopy, x-ray photoelectron spectroscopy, and nano-indentation. The results were as follows: the sp(3) content, hardness, and Young's modulus of the DLC films increased with increasing RF power at a constant DC bias of -200 V and reached the maximum values at an RF power of 300 W, after which they decreased with further increase of the RF power. The DC bias had a similar but greater effect on the structure and properties of the films, owing to a greater influence of the ion energy on the characteristics of the films than the ion current density. The film deposited at an RF power of 300 W and DC bias of -200 V has the most diamond-like characteristics with maximum hardness, Young's modulus, and sp(3) content. Since both the ion current density and ion energy greatly affect the structure and characteristics of the DLC films, it is imperative to select proper processing parameters to obtain high quality DLC films. [References: 45]
机译:双直流和射频(DC-RF)等离子体系统用于从甲烷等离子体中沉积氢化的类金刚石碳(DLC)膜。与常规的简单电容耦合的射频等离子体增强化学气相沉积系统相比,它具有分别通过RF功率和DC偏压分别控制离子密度和离子能量的优势。因此,使用CH4加Ar作为原料,在不同的RF功率和DC偏压下获得了氢化的DLC膜。通过傅里叶变换红外光谱,拉曼光谱,X射线光电子能谱和纳米压痕研究了射频功率和直流偏压对薄膜结构和性能的影响。结果如下:DLC薄膜的sp(3)含量,硬度和杨氏模量随着在-200 V恒定DC偏压下的RF功率的增加而增加,并在300 W的RF功率下达到最大值。随着射频功率的进一步增加,它们降低了。由于离子能量对薄膜特性的影响大于离子电流密度,因此直流偏压对薄膜的结构和性能具有相似但更大的影响。以300 W的RF功率和-200 V的DC偏压沉积的薄膜具有最类似于钻石的特性,具有最大的硬度,杨氏模量和sp(3)含量。由于离子电流密度和离子能量都极大地影响DLC膜的结构和特性,因此必须选择适当的处理参数以获得高质量的DLC膜。 [参考:45]

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