Ion trajectories in atom probe field ion microscopy and gas field ion sources

摘要

Trajectories of positive ions produced in a region close to a structured surface, modelled by spherical or spheroidal protrusions and kept at a positive electric potential with respect to a distant screen or detector are calculated. The results are discussed in comparison with similar practical situations produced by field ionization and field evaporation or desorption, such as those occurring in gas field ion sources, field ion microscopy and field desorption spectroscopy.