首页> 外文期刊>Journal of Physics, B. Atomic, Molecular and Optical Physics: An Institute of Physics Journal >Measurements of absolute L- and M-subshell x-ray production cross sections of Pb by electron impact
【24h】

Measurements of absolute L- and M-subshell x-ray production cross sections of Pb by electron impact

机译:通过电子碰撞测量铅的L壳和M壳的绝对X射线产生截面

获取原文
获取原文并翻译 | 示例
           

摘要

Absolute L- and M-subshell x-ray production cross sections of Pb have been measured for incident electron energies ranging from 3 to 38 keV. The experimental cross sections were obtained by measuring Lα, Lβ, Mα, Mβ and Mγ x-ray intensities emitted from ultrathin Pb films deposited onto self-supporting thin C films. Measurements were performed on two electron microprobes using wavelength-dispersive spectrometers. X-ray intensities were converted into x-ray production cross sections by using estimated values of the number of incident electrons, target thickness and spectrometer efficiency. Experimental results are compared with calculated cross sections obtained using different predictive formulae, and, whenever possible, with experimental data from the literature.
机译:对于入射电子能量为3到38 keV,已经测量了Pb的绝对的L和M子壳X射线产生截面。通过测量从沉积在自支撑薄C膜上的超薄Pb膜发出的Lα,Lβ,Mα,Mβ和MγX射线强度获得实验横截面。使用波长分散光谱仪在两个电子微探针上进行测量。通过使用入射电子数,目标厚度和光谱仪效率的估计值,将X射线强度转换为X射线产生的横截面。将实验结果与使用不同预测公式获得的计算横截面进行比较,并尽可能与文献中的实验数据进行比较。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号