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Measurements of absolute Ma x-ray production cross sections of heavy elements Au, Pb, Bi, and U by electron impact

机译:通过电子碰撞测量重元素Au,Pb,Bi和U的绝对Ma X射线产生截面

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摘要

Absolute M x-ray production cross sections have been measured and calculated for heavy elements Au, Pb, Bi, and U for electron incident energies from the ionization threshold up to 38keV. The experimental cross sections were deduced from M x-ray intensities emitted from ultrathin samples of the elements of interest deposited onto self-supporting C films. The measurements were performed using two electron microprobes and several wavelength-dispersive spectrometers. X-ray intensities were converted into x-ray production cross sections by using estimated values of the number of incident electrons, target thickness, and spectrometer efficiency. Experimental results are compared with calculated cross sections using different predictive formulae. Good agreement is found between the measured cross sections and the predictions from the distorted-wave Born approximation, which indicates that this approximation is suited for the calculation of M-shell ionization cross sections of heavy elements. Copyright (c) 2014 John Wiley & Sons, Ltd.
机译:已测量并计算了重离子Au,Pb,Bi和U的绝对M x射线产生截面,这些离子的电子入射能从电离阈值到38keV。实验截面由沉积在自支撑C膜上的目标元素的超薄样品发出的M x射线强度推导得出。使用两个电子微探针和几个波长色散光谱仪进行测量。通过使用入射电子数,目标厚度和光谱仪效率的估计值,将X射线强度转换为X射线产生的横截面。使用不同的预测公式将实验结果与计算出的横截面进行比较。在测量的横截面与失真波Born近似的预测之间找到了很好的一致性,这表明该近似适合于计算重元素的M壳电离横截面。版权所有(c)2014 John Wiley&Sons,Ltd.

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