...
首页> 外文期刊>Physical Review, A. Atomic, molecular, and optical physics >ar-threshold absolute M-shell x-ray production cross sections of Au and Bi by electron impact
【24h】

ar-threshold absolute M-shell x-ray production cross sections of Au and Bi by electron impact

机译:电子碰撞对Au和Bi的阈值绝对M壳x射线产生截面

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

Absolute M-shell x-ray production cross sections have been measured and calculated for Au and Bi forelectron incident energies from close to the ionization threshold up to 38 keV. The experimental cross sectionswere deduced from Ma x-ray intensities emitted from ultrathin Au and Bi samples deposited on self-supportingC films. The measurements were performed on an electron microprobe using several wavelength-dispersivespectrometers. The x-ray production cross sections were also evaluated theoretically using ionization crosssections calculated from the plane-wave and the distorted-wave Born approximations. Experimental results arecompared with the calculated cross sections and also with the results of two analytical formulas widely used inmany applications. Good agreement is found between the measured cross sections and the predictions from thedistorted-wave Born approximation, which indicates that this approximation is suited for the calculation ofM-shell ionization cross sections of heavy elements.
机译:已经测量并计算了电子入射能的Au和Bi绝对M壳X射线产生截面,其电子离能从接近电离阈值到高达38 keV。实验截面由沉积在自支撑C薄膜上的超薄Au和Bi样品发出的Ma X射线强度推导得出。使用数个波长色散光谱仪在电子探针上进行测量。理论上,还使用从平面波和畸变波的Born近似计算得出的电离截面,对X射线的产生截面进行了评估。将实验结果与计算出的横截面进行比较,并与许多应用中广泛使用的两个分析公式进行比较。在实测横截面与失真波Born近似的预测之间找到了很好的一致性,这表明该近似适合于计算重元素的M壳电离横截面。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号