Rapid and Precise Detection of Latent Infections of Wheat Stripe Rust in Wheat Leaves using Loop-Mediated Isothermal Amplification

摘要

Wheat stripe rust caused by Puccinia striiformis f.sp. tritici (Pst) is one of the most important diseases of wheat worldwide. Detection of latent infection in leaves is critical for estimating the initial inoculum potential of epidemics. A loop-mediated isothermal amplification (LAMP) assay was developed and evaluated for the detection of Pst DNA in spores and wheat seedlings with latent infections. LAMP assay could detect as low as 2 pg/mu l template DNA and detect latent infections from leaves as early as 24 h after inoculation. This provides a rapid and accurate method of estimating latent infection levels.