首页> 外文期刊>Journal of Nuclear Materials: Materials Aspects of Fission and Fusion >The search for interstitial dislocation loops produced in displacement cascades at 20 K in copper
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The search for interstitial dislocation loops produced in displacement cascades at 20 K in copper

机译:寻找在20 K的铜中位移级联中产生的间隙位错环

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A low-temperature in situ ion-irradiation and annealing experiment has been performed in copper. Most clusters which persisted through an anneal to 120 K showed no size changes within the resolution (0.5 nm) of a new weak-beam sizing technique. Of the 55 defects measured under a range of weakly diffracting conditions, seven showed measurable size decreases while three showed size increases. We argue that these clusters are likely to be of vacancy and interstitial nature, respectively. Also on annealing to 120 K a fraction of about 25% of the clusters formed by irradiation with 600 kV Cu+ ions at 20 K disappeared, while a similar number of clusters appeared at different locations. The remaining defects persisted through the anneal, sometimes however with modified morphologies. Video microscopy suggested that the disappearance and appearance of clusters occurred gradually and was unlikely to be due to loop movement. Some arguments on the possible nature of these clusters are presented. On warming specimens to room temperature, a high density of small stacking-fault tetrahedra appeared close to the electron-exit surface of the foil in regions which had been exposed to the electron beam at low temperatures. These are most likely due to the clustering of vacancies produced by sputtering at the back surface. (C) 2000 Elsevier Science B.V. All rights reserved. [References: 13]
机译:在铜中进行了低温原位离子辐照和退火实验。持续退火至120 K的大多数簇在新的弱束定径技术的分辨率(0.5 nm)范围内均未显示尺寸变化。在一系列弱衍射条件下测量的55个缺陷中,有七个显示出可测量的尺寸减小,而三个显示出尺寸增大。我们认为,这些簇可能分别具有空位和间隙性质。同样在退火至120 K时,通过在20 K下用600 kV Cu +离子辐照形成的簇中约25%的部分消失了,而在不同位置出现了相似数目的簇。剩余的缺陷会在退火过程中持续存在,但有时会发生变形。视频显微镜显示,簇的消失和出现是逐渐发生的,不太可能是由于环的运动。提出了关于这些集群的可能性质的一些论据。在将样品加热到室温的情况下,在低温下暴露于电子束的区域中,靠近箔片的电子出口表面出现了高密度的小堆积缺陷四面体。这些最有可能是由于在背面溅射所产生的空位的聚集。 (C)2000 Elsevier Science B.V.保留所有权利。 [参考:13]

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