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首页> 外文期刊>Journal of pharmaceutical sciences. >Surface roughness contribution to the adhesion force distribution of salmeterol xinafoate on lactose carriers by atomic force microscopy.
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Surface roughness contribution to the adhesion force distribution of salmeterol xinafoate on lactose carriers by atomic force microscopy.

机译:通过原子力显微镜,表面粗糙度对新萘甲酸沙美特罗在乳糖载体上的粘附力分布有贡献。

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Adhesion force distributions of silica spheres (5 and 20 microm) and salmeterol xinafoate (4 microm) particles with inhalation grade lactose surfaces and spin coated lactose films were determined by atomic force microscopy (AFM) to investigate the influence of surface roughness on the force distributions. The roughness of lactose particles and films was determined by both AFM and confocal microscopy (CM); the lactose particles showed RMS R(q) values between 0.93 and 2.2 microm. The adhesion force distributions for silica and SX probes were significantly different for the different lactose carriers and broad, e.g., the adhesion force distribution between a 5 microm silica sphere and lactose particles ranged from 5 to 105 nN. This contrasted with distributions on smooth spin coated lactose films (RMS R(q) of 0.28 nm) which were not significantly different and were narrow, e.g., the adhesion force distribution between a 5 microm silica sphere and spin coated lactose films was between 42 and 68 nN. In addition, no significant difference in adhesion force distribution occurred with silica probe size on the lactose carrier surface. The use of X-ray photoelectron spectroscopic analysis confirmed that the lactose surfaces were free of impurities that might contribute to variation in adhesion. Although the almost atomically flat films showed some adhesion variability, the surface roughness of the lactose particles was a major contributing factor to the broad distributions seen in this study. (c) 2005 Wiley-Liss, Inc. and the American Pharmacists Association J Pharm Sci 94:1500-1511, 2005.
机译:用原子力显微镜(AFM)测定了具有吸入级乳糖表面和旋涂乳糖膜的二氧化硅球(5和20微米)和沙美特罗新萘酸酯(4微米)颗粒的粘附力分布,以研究表面粗糙度对力分布的影响。乳糖颗粒和薄膜的粗糙度通过原子力显微镜和共聚焦显微镜(CM)测定。乳糖颗粒的RMS R(q)值在0.93至2.2微米之间。对于不同的乳糖载体,二氧化硅和SX探针的粘附力分布明显不同,例如5微米二氧化硅球和乳糖颗粒之间的粘附力分布范围从5到105 nN。这与光滑的旋涂乳糖膜(RMS R(q)为0.28 nm)上的分布没有明显差异且窄,例如5微米硅胶球与旋涂乳糖膜之间的粘附力分布在42到42 68 nN。另外,乳糖载体表面上的二氧化硅探针尺寸与粘附力分布没有显着差异。 X射线光电子能谱分析的使用证实了乳糖表面没有杂质,可能有助于粘附力的变化。尽管几乎原子级的平坦膜表现出一定的粘附性变化,但乳糖颗粒的表面粗糙度是导致本研究中广泛分布的主要因素。 (c)2005 Wiley-Liss,Inc.和美国药剂师协会J Pharm Sci 94:1500-1511,2005。

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