首页> 外文期刊>Journal of optoelectronics and advanced materials >OBSERVATION OF MEYER-NELDEL RULE IN a- Se6oTe2oGe2o THIN FILMS IN PRESENCE OF LIGHT
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OBSERVATION OF MEYER-NELDEL RULE IN a- Se6oTe2oGe2o THIN FILMS IN PRESENCE OF LIGHT

机译:有光下a-Se6oTe2oGe2o薄膜中迈耶-内德尔规则的观察

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摘要

In general, in case of semiconductors, conductivity (a) varies exponentially with temperature, in many amorphous and liquid semiconductors and many other class of materials. cr0 is found to increase exponentially with AE. This is called Meyer- Neldel rule. This rule is generally verified by selecting different compositions of different AE in a given class of materials. This opens a possibility of change in various other physical properties apart from AE. In the present paper, we report on the observation of Meyer- Neldel rule where AE is varied by varying the intensity of light while measuring the photoconductivity in amorphous thin films of Se6oTe2oGe2o instead of changing composition of the glassy system. The observation of Meyer-Neldel rule in the present case indicates that this rule is more general and does not cause due to change in density or distribution of defect states or any other physical property due to change in composition.
机译:通常,在半导体的情况下,在许多非晶态和液态半导体以及许多其他类型的材料中,电导率(a)随温度呈指数变化。发现cr0随着AE呈指数增加。这称为Meyer- Neldel规则。通常通过在给定类别的材料中选择不同AE的不同成分来验证该规则。这为除AE以外的其他各种物理性质带来了改变的可能性。在本文中,我们报告了Meyer-Neldel法则的观察结果,其中通过改变光强度,同时测量Se6oTe2oGe2o非晶薄膜中的光电导率来改变AE,而不是改变玻璃态系统的组成。在当前情况下对Meyer-Neldel规则的观察表明,该规则更为通用,不会因缺陷状态的密度或分布的变化或由于成分变化而引起的任何其他物理性质的变化而引起。

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