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首页> 外文期刊>Journal of Micromechanics and Microengineering >Fabrication of microstructured silicon (μs-Si) from a bulk Si wafer and its use in the printing of high-performance thin-film transistors on plastic substrates
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Fabrication of microstructured silicon (μs-Si) from a bulk Si wafer and its use in the printing of high-performance thin-film transistors on plastic substrates

机译:从块状硅晶片制造微结构硅(μs-Si)及其在塑料基板上印刷高性能薄膜晶体管中的用途

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摘要

In this paper, we report a new fabrication route to generate microstructured, single-crystalline silicon (μs-Si) ribbons using (110) silicon. Two different methods were explored for producing these printable structures. This work also introduces a second-process innovation in the fabrication of microstructured semiconductor objects for printed large-area circuits, namely the direct integration of a high-quality, thermally grown silicon dioxide (SiO_2) layer for use as a gate dielectric in top-gate metal-oxide-silicon field effect transistors. We also demonstrate and characterize a soft, conformable lamination process that considerably enhances the mechanical stability of devices printed on plastic, allowing bending radii as small as 0.8 cm. These structures enable a reduction of the bending strains localized at the device interface. These improvements were fully characterized by finite element simulations of the strain distribution present in a descriptive model of the multilayer laminated circuit.
机译:在本文中,我们报告了一种使用(110)硅生成微​​结构化单晶硅(μs-Si)带的新制造途径。探索了两种不同的方法来生产这些可印刷的结构。这项工作还为印刷大面积电路的微结构半导体物体的制造引入了第二步创新,即直接集成高质量,热生长的二氧化硅(SiO_2)层,用作顶部的栅极电介质。栅极金属氧化物硅场效应晶体管。我们还演示并表征了一种柔软,贴合的层压工艺,该工艺可大大提高印刷在塑料上的设备的机械稳定性,并允许弯曲半径小至0.8厘米。这些结构使得能够减小位于设备界面处的弯曲应变。这些改进通过多层层压电路的描述模型中存在的应变分布的有限元模拟得以充分表征。

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