首页> 外文期刊>Journal of Micromechanics and Microengineering >Fabrication and characterization of thermally actuated micromechanical resonators for airborne particle mass sensing: II. Device fabrication and characterization
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Fabrication and characterization of thermally actuated micromechanical resonators for airborne particle mass sensing: II. Device fabrication and characterization

机译:用于航空颗粒质量传感的热致动微机械谐振器的制造和表征:II。器件制造与表征

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This paper, the second of two parts, presents extensive measurement and characterization results on fabricated thermally actuated single-crystal silicon MEMS resonators analyzed in part I. The resonators have been fabricated using a single mask process on SOI substrates. Resonant frequencies in a few hundreds of kHz to a few MHz and equivalent motional conductances as high as 102 mA V~(-1) have been measured for the fabricated resonators. The measurement results have been compared to the resonator characteristics predicted by the model developed in part I showing a good agreement between the two. Despite the relatively low frequencies, high quality factors (Q) of the order of a few thousand have been measured for the resonators under atmospheric pressure. The mass sensitivities of some of the resonators were characterized by embedding them in a custom-made test setup and deposition of artificially generated aerosol particles with known size and composition. The resulting measured mass sensitivities are of the order of tens to hundreds of Hz ng~(-1) and are in agreement with the expected values based on the resonator's physical dimensions. Finally, measurement of mass density of arbitrary airborne particles in the surrounding lab environment has been demonstrated.
机译:本文是第二部分,第二部分介绍了在第一部分中分析的制造的热激励单晶硅MEMS谐振器的广泛测量和特性结果。这些谐振器是在SOI衬底上使用单掩模工艺制造的。对于所制造的谐振器,已经测量了几百kHz至几MHz的谐振频率以及高达102 mA V〜(-1)的等效运动电导。将测量结果与第一部分中开发的模型预测的谐振器特性进行了比较,表明两者之间有很好的一致性。尽管频率相对较低,但在大气压力下已为谐振器测得了数千级的高质量因数(Q)。一些谐振器的质量敏感性的特征在于,将其嵌入到定制的测试设备中,并沉积出具有已知尺寸和成分的人工生成的气溶胶颗粒。测得的质量灵敏度约为数十至数百Hz ng〜(-1),并与基于谐振器物理尺寸的预期值一致。最后,已经证明了在周围实验室环境中测量任意空气传播颗粒的质量密度的方法。

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