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SiO_x nanowires with intrinsic nC-Si quantum dots: the enhancement of the optical absorption and photoluminescence

机译:具有固有nC-Si量子点的SiO_x纳米线:增强了光吸收和光致发光

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We report a very simple method for the fabrication of amorphous silicon rich oxide nanowires (a-SiO_x NWs) with intrinsic nanocrystalline silicon quantum dots (nC-Si QDs) with a high density and controlled size, by thermally annealing thin films of nC-Si quantum dots embedded in the a-SiO, matrix, overcoated by an ultra-thin Au catalyst layer. The size and density of the Si-QDs in the basic matrix are controllable by changing the plasma parameters during the growth of the nC-Si/a-SiO_x thin films. The diameter of the grown SiO_x nanowires is controlled by merely varying the thickness of the Au-coating. The formation of the 1D NWs with rigid boundaries influences a shrinkage in the size of the intrinsic OD QDs; the size-reduction of the QDs is more prominent in narrower NWs obtained from thinner catalyst layers. This unique quantum-dotanowire composite system demonstrates a significantly improved optical absorption and reduced reflection in the entire UV-visible range of the solar spectrum compared to its thin film structure, and those are again pronounced by reducing the dimension of the nanowires. The photoluminescence properties of this composite system demonstrate a strong room temperature emission band in the range of 400-600 nm with a peak at ~519 nm. The PL peak of the NW film undergoes a large blue shift by 150 nm from that of the annealed QD films which has been attributed to the reduction in the average size of the intrinsic nC-Si QDs during the growth of the a-SiO_x NWs. These novel a-SiO_x NWs with intrinsic nC-Si QDs, produced by a simple synthesis technique involving a solid-liquid-solid (SLS) growth process, deserve enough promise in the field of photovoltaics and light emitting devices.
机译:我们报告了一种非常简单的方法,可以通过对nC-Si薄膜进行热退火来制造具有高密度和受控尺寸的本征纳米晶硅量子点(nC-Si QDs)的非晶态富硅氧化物纳米线(a-SiO_x NWs)嵌入a-SiO基质中的量子点,被超薄的Au催化剂层覆盖。通过在nC-Si / a-SiO_x薄膜的生长过程中改变等离子体参数,可以控制基本基质中Si-QD的大小和密度。仅通过改变Au涂层的厚度来控制生长的SiO_x纳米线的直径。具有刚性边界的一维NW的形成会影响本征OD QD尺寸的缩小。从较薄的催化剂层获得的较窄的NW中,QD的尺寸减小更为突出。与它的薄膜结构相比,这种独特的量子点/纳米线复合系统在太阳光谱的整个UV-可见光范围内显示出显着改善的光吸收和减少的反射,并且通过减小纳米线的尺寸而再次显着。该复合系统的光致发光性能证明其在400-600 nm范围内具有很强的室温发射带,在〜519 nm处有一个峰。 NW膜的PL峰比退火QD膜的PL峰出现大的蓝移150 nm,这归因于a-SiO_x NWs生长过程中本征nC-Si QD的平均尺寸减小。这些具有固有nC-Si QD的新颖a-SiO_x NW,是通过涉及固液固(SLS)生长过程的简单合成技术生产的,在光伏和发光器件领域应有足够的希望。

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