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Understanding the defect chemistry of tin monoxide

机译:了解一氧化锡的缺陷化学

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摘要

Tin monoxide has garnered a great deal attention in the recent literature, primarily as a transparent p-type conductor. However, due to its layered structure (dictated by non-bonding dispersion forces) simulation via density functional theory often fails to accurately model the unit cell. This study applies a PBEO-vdW methodology to accurately predict both the atomic and electronic structure of SnO. Empirical van der Waals corrections improve the structure, with the calculated c/a ratio matching experiment, while the PBEO hybrid-DFT method gives accurate band gaps (0.67 and 2.76 eV for the indirect and direct band gaps) and density of states which are in agreement with experimental spectra. This methodology has been applied to the simulation of the native intrinsic defects of SnO, to further understand the conductivity; The results indicate that n-type conductivity will not arise from intrinsic defects and that donor doping would be necessary. For p-type conduction, the Sn vacancy is seen to be the source, with the 0/-1 transition level found 0.39 eV above the valence band maximum. By considering the formation energies and transition levels of the defects at different chemical potentials, it is found that the p-type conductivity is sensitive to the 0 chemical potential. When the chemical potential is close to its lowest value (-2.65 eV here), the oxygen vacancy is stabilized which, whilst not leading to n-type conduction, could reduce p-type conduction by limiting the formation of hole states.
机译:一氧化锡在最近的文献中已经引起了很多关注,主要是作为透明的p型导体。但是,由于其分层结构(由非结合分散力决定),通过密度泛函理论进行的模拟通常无法准确地对晶胞进行建模。这项研究应用PBEO-vdW方法来准确预测SnO的原子和电子结构。经验范德华校正通过计算的c / a比匹配实验改善了结构,而PBEO混合DFT方法给出了精确的带隙(间接带隙和直接带隙分别为0.67和2.76 eV)和处于与实验光谱一致。该方法已应用于模拟SnO的固有固有缺陷,以进一步了解电导率。结果表明,n型电导率不会因固有缺陷而产生,并且施主掺杂将是必需的。对于p型传导,Sn空位被视为来源,其0 / -1跃迁能级比价带最大值高0.39 eV。通过考虑在不同化学势下的形成能和缺陷的转变能级,发现p型电导率对0化学势敏感。当化学势接近其最低值(此处为-2.65 eV)时,氧空位得以稳定,这虽然不会导致n型导电,但可以通过限制空穴状态的形成来降低p型导电。

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