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首页> 外文期刊>Journal of nanoscience and nanotechnology >Structure and Physical Properties of Undoped ZnO and Vanadium Doped ZnO Films Deposited by Pulsed Laser Deposition
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Structure and Physical Properties of Undoped ZnO and Vanadium Doped ZnO Films Deposited by Pulsed Laser Deposition

机译:脉冲激光沉积非掺杂ZnO和钒掺杂ZnO薄膜的结构和物理性质

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摘要

Undoped ZnO films were deposited using pulsed laser deposition technique on Si and glass substrates in different O{sub}2 partial pressures (ranging from 10{sup}(-5) mbar to 3 mbar) and substrate temperatures. When the substrate temperature is 500℃ and O{sub}2 partial pressure (pp)~3 mbar, randomly oriented ZnO hexagons were observed on glass substrate, whereas, dense ZnO hexagonal rod like structures (diameter ranging from 200-500 nm) were observed on Si substrate. The photoluminescence (PL) characterization of ZnO film grown on Si exhibited an intense defect free narrow excitonic emission in the UV region (Full width half maximum (FWHM) ~11.26 nm) as compared to broad emission (FWHM ~57.06 nm) from that grown on glass. The parent film emission was found to shift from UV to blue region on doping ZnO with Vanadium.
机译:使用脉冲激光沉积技术以不同的O {sub} 2分压(范围为10 {sup}(-5)mbar至3 mbar)和衬底温度在硅和玻璃基板上沉积未掺杂的ZnO薄膜。当基底温度为500℃且O {sub} 2分压(pp)〜3 mbar时,在玻璃基底上观察到随机取向的ZnO六角形,而致密的ZnO六角形棒状结构(直径为200-500 nm)则为在Si衬底上观察到。 Si上生长的ZnO薄膜的光致发光(PL)表征显示,与之相比,在生长区的宽发射(FWHM〜57.06 nm)处,紫外区(全宽半高(FWHM)〜11.26 nm)表现出强烈的无缺陷的窄激子发射。在玻璃上。发现在掺杂钒的ZnO上,母膜的发射从UV转变为蓝色区域。

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