XRD profile analysis and transmission electronic microscopy observation for a plastically deformed 7475 aluminum alloy

摘要

An improved understanding of deformation modes for polycrystalline materials requires statistical information about the dislocation substructures. However, they have been studied mainly by direct methods such as observation by optical microscope or transmission electron microscope (TEM). TEM analysis allows direct observation of the microstruc-ture features (grain boundaries, dislocation cells, etc.) but at a very local scale of the studied volume, and one must be very careful with thin foil preparation or interpretation as far as problems like relaxation effect, or dislocation-surface interaction may be concerned [1-4].