...
首页> 外文期刊>Journal of Materials Science Letters >Ceramic thin film thickness determination by nano-indentation
【24h】

Ceramic thin film thickness determination by nano-indentation

机译:通过纳米压痕确定陶瓷薄膜厚度

获取原文
获取原文并翻译 | 示例
           

摘要

Nano-indentation acts as a microprobe for the determination of mechanical properties of very small volumes of materials. Oliver and Pharr [1] and more recently Felder et cil. [2] published methods to calculate Young's modulus and hardness of the indented material. The low loads used and consequently the depths which are involved (several tens of nanometers) make nano-indentation very useful to determine the properties of coatings a few microns thick.
机译:纳米压痕用作确定极少量材料的机械性能的微探针。 Oliver和Pharr [1],以及最近的Felder等人。 [2]发表了计算压痕材料的杨氏模量和硬度的方法。所用的低载荷以及所涉及的深度(数十纳米)使得纳米压痕对于确定几微米厚的涂层的性能非常有用。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号