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Microstructure, electrical properties, and degradation behavior of praseodymium oxides-based zinc oxide varistors doped with Y_(2)O_(3)

机译:Y_(2)O_(3)掺杂的氧化ody基氧化锌压敏电阻的微观结构,电性能和降解行为

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摘要

The microstructure, electrical properties, and degradation behavior of Pr-based zinc oxide varistors, which are composed of Zn-Pr-Co-Cr-Y oxides were investigated according to Y_(2)O_(3) additive content in the range of 0.5-4.0 mol%. The majority of the added Y_(2)O_(3) were segregated at the multiple ZnO grain junctions and grain boundaries. The average grain size was markedly decreased in the range of 27.3-8.6 μm with increasing Y_(2)O_(3) additive content. Y_(2)O_(3) acted as an inhibitor of grain growth. Additions of Y_(2)O_(3) increased the varistor voltage in the range of 36.90-686.58 V/mm, increased the nonlinear exponent in the range of 3.75-87.42, decreased the leakage current in the range of 115.48-0.047 μA, increased the barrier height in the range of 1.06-2.16 eV, and decreased the donor concentration in the range of 1.87×10~(18)-0.19×10~(18) cm~(-3). Y_(2)O_(3) acted as an acceptor, as a result of the decrease of donor concentration. All Pr-based ZnO varistors doped with Y_(2)O_(3) exhibited very predominant degradation characteristics, which show nearly symmetric I-V characteristics after the stress. In particular, since 4.0 mol% Y_(2)O_(3)-added ZnO varistor has not only very excellent non-ohmicity, but also very stable degradation behavior, it is estimated to be sufficiently used to various application fields.
机译:根据Y_(2)O_(3)的添加量在0.5的范围内,研究了由Zn-Pr-Co-Cr-Y氧化物组成的Pr基氧化锌压敏电阻的微观结构,电性能和降解行为。 -4.0摩尔%。添加的Y_(2)O_(3)的大部分被隔离在多个ZnO晶粒结和晶界处。随着Y_(2)O_(3)添加剂含量的增加,平均晶粒尺寸在27.3-8.6μm范围内显着减小。 Y_(2)O_(3)充当晶粒生长的抑制剂。 Y_(2)O_(3)的添加使压敏电阻电压在36.90-686.58 V / mm的范围内增加,非线性指数在3.75-87.42的范围内增加,漏电流在115.48-0.047μA的范围内减小,在1.06-2.16 eV范围内增加势垒高度,在1.87×10〜(18)-0.19×10〜(18)cm〜(-3)范围内降低施主浓度。由于供体浓度的降低,Y_(2)O_(3)成为受体。所有掺有Y_(2)O_(3)的Pr基ZnO压敏电阻均表现出非常显着的降解特性,在应力作用下,其I-V特性几乎对称。特别地,由于添加了4.0mol%的Y_(2)O_(3)的ZnO压敏电阻不仅具有非常优异的非欧姆性,而且还具有非常稳定的降解性能,因此据估计可充分用于各种应用领域。

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