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首页> 外文期刊>Journal of Materials Science >Epitaxial growth of ZnO films on (100) and (001) gamma-LiAlO2 substrates by pulsed laser deposition
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Epitaxial growth of ZnO films on (100) and (001) gamma-LiAlO2 substrates by pulsed laser deposition

机译:通过脉冲激光沉积在(100)和(001)γ-LiAlO2衬底上外延生长ZnO膜

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摘要

Structural and optical properties were investigated for ZnO films grown on (100) and (001) gamma-LiAlO2 (LAO) substrates by pulsed laser deposition method. According XRD results, it is intuitionistic that (100) LAO is suitable for fabricating high quality ZnO film, while (001) LAO is unsuitable. The FWHM of XRD, stress in film and FWHM of UV PL spectra for ZnO films on (100) LAO show a decreasing with increasing substrate temperature from 300 to 600 degrees C. ZnO film fabricated at 600 degrees C has the greatest grain size, the smallest stress (0.47 Gpa) and PL FWHM value (similar to 85 meV). This means that the substrate temperature of 600 degrees C is optimum for ZnO film deposited on (100) LAO. Moreover, it was found that the UV PL spectra intensity of ZnO film is not only related to the grain size and stoichiometric, but also depends on the stress in the film.
机译:通过脉冲激光沉积方法研究了在(100)和(001)γ-LiAlO2(LAO)衬底上生长的ZnO膜的结构和光学性质。根据XRD结果,直觉上(100)LAO适合于制造高质量的ZnO膜,而(001)LAO不适合。 (100)LAO上的ZnO薄膜的XRD的FWHM,薄膜中的应力和UV PL光谱的FWHM随着基底温度从300摄氏度增加到600摄氏度而降低。在600摄氏度下制造的ZnO薄膜具有最大的晶粒尺寸,最小应力(0.47 Gpa)和PL FWHM值(类似于85 meV)。这意味着600摄氏度的基板温度对于(100)LAO上沉积的ZnO薄膜是最佳的。此外,发现ZnO膜的UV PL光谱强度不仅与晶粒尺寸和化学计量有关,而且还取决于膜中的应力。

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