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Study of transport properties of Ge50-xSbyTe100+x-y thin film alloy

机译:Ge50-xSbyTe100 + x-y薄膜合金的传输性能研究

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The transport properties of Ge50-xSbyTe100+x-y Alloys where 0 <= x <= 15 and 0 <= y <= 30 in the thin films state were studied. The temperature dependence of the d.c. electrical conductivity measurements for all prepared composition with different thickness, shows that, all samples behaves as a semiconductor up to a specific temperature at which an abrupt transition appears. That transition is due to the change of the semiconductor from non-degenerate to degenerate state. The temperature dependence of a.c. electrical conductivity measurements shows that, the a.c. conductivity for all films are frequency independent in the tested frequency range from 0.12 to 10 kHz. Thermoelectric power was found to have positive sign indicating that these alloys are p-type semiconductors. The value of temperature coefficient gamma was found to be in the order of 10(-4) stop (eV/K). The calculation of the free-charge carrier concentration and charge mobility shows that, the abrupt transition appears in thermoelectric power and conductivity are due to an abrupt increase in the mobility. (c) 2006 Springer Science+ Business Media, Inc.
机译:研究了薄膜状态下0 <= x <= 15和0 <= y <= 30的Ge50-xSbyTe100 + x-y合金的传输性能。直流电的温度依赖性对所有制备的具有不同厚度的组合物的电导率测量结果表明,所有样品在达到特定温度时都表现为半导体,在该温度下出现突然转变。该转变是由于半导体从未退化状态到退化状态的变化。交流电的温度依赖性电导率测量表明,交流电在0.12至10 kHz的测试频率范围内,所有薄膜的电导率均与频率无关。发现热电具有正号,表明这些合金是p型半导体。发现温度系数γ的值约为10(-4)档(eV / K)。自由电荷载流子浓度和电荷迁移率的计算表明,在热电功率和电导率中出现突然的转变是由于迁移率的突然增加。 (c)2006年Springer Science + Business Media,Inc.

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