Characteristic and non-characteristic X-ray yields produced from thick Ti element by sub-relativistic electrons

摘要

Measurements are performed to study the electron impact energy dependence of doubly differential bremsstrahlung yields (DDBY) and of characteristic Ti K_α line yields produced from sub-relativistic electrons (10-25 keV) colliding with a thick Ti (Z = 22) target. The emitted radiation is detected by a Si-PIN photo-diode detector with energy resolution (FWHM) of 180 eV at 5.9 keV. The measured data of DDBY are compared with the results predicted by Monte-Carlo (MC) simulations using the general purpose PENELOPE code. A reasonable agreement is found between experimental and simulation results within the experimental uncertainty of measurements of 12%. Characteristic Ti K _α yields are obtained for the considered impact energy range and they are compared with the existing theoretical results. A good agreement is found between the present measurements and the theoretical calculations. Furthermore, data are presented for impact energy dependence of the ratio K _α/(K_α+ K_β) of a thick Ti target under impact of 10-25 keV electrons. The ratio shows a very weak dependence on impact energy in the studied range. The average value of the ratio is found to be 0.881 ± 0.003.