Fractal analysis of AFM data characterizing strongly isotropic and anisotropic surface topography (Conference Paper)

摘要

This study discusses changes in angle-dependent fractal parameters determined for surfaces with different anisotropy ratios. The studied surfaces were PG (Bruker), TGT1 and TGZ1 (NT-MDT) calibration standards as models of isotropic and anisotropic surfaces. Surface topography was scanned using Atomic Force Microscopy (AFM). The obtained results indicate that fractal parameters (fractal dimension, topothesy) can be easily derived in each case, and that changes in their angle-dependent characteristics can be associated with the anisotropy ratio.