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Determination of surface roughness and topography of dental resin-based nanocomposites using AFM analysis

机译:使用AFM分析确定牙科树脂基纳米复合材料的表面粗糙度和形貌

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摘要

The aim of this study was to determine surface roughness and topography of polished dental resin-based nanocomposites.Four representative dental resin-based nanocomposites were tested in the study: two nanohybrids (Filtek Z550 and Tetric EvoCeram) and two nanofilled (Filtek Ultimate Body and Filtek Ultimate Translucent); and two reference materials: one microfilled (Gradia Direct) and one microhybrid (Filtek Z250). Polymerized cylindrical specimens (4 mm x 2 mm) were polished with multi-step polishing system-Super Snap. Immediately after the polishing, topography of each specimen was examined by Veeco di CP-II Atomic Force Microscope. Specimen’s surface has been scanned in 6 points in contact mode with CONT20A-CP tips. 1 Hz scan rate and 256 x 256 resolution were used to obtain topography on a 90 μm x 90 μm scanning area. Measured topography data were processed by Image Processing and Data Analysis V2.1.15 software. Following parameters were compared among specimens: average roughness and maximum peak-to-valley distance.All of the tested materials had similar average surface roughness after finishing and polishing procedure. The lowest values occurred in the material Filtek Ultimate Body, and the highest in the Filtek Z550. When interpreting maximum peak-to-valley distance the larger differences in values (up to 100%) occurred in Filtek Z550, Filtek Z250 and Filtek Ultimate Body, which is a result of the deep polishing channels and tracks. Type, size, distribution of fillers and filler loading in tested materials, didn’t influence average roughness values, but had an impact on maximum peak-to-valley distance values.
机译:这项研究的目的是确定抛光的牙科树脂基纳米复合材料的表面粗糙度和形貌。在该研究中测试了四种代表性的牙科树脂基纳米复合材料:两种纳米复合材料(Filtek Z550和Tetric EvoCeram)和两种纳米填充材料(Filtek Ultimate Body和Filtek Ultimate半透明);以及两种参考材料:一种是微填充的(Gradia Direct),另一种是微混合材料(Filtek Z250)。使用多步抛光系统Super Snap对聚合的圆柱形试样(4 mm x 2 mm)进行抛光。抛光后,立即通过Veeco di CP-II原子力显微镜检查每个样品的形貌。用CONT20A-CP吸头以接触模式对样品的表面进行了6点扫描。 1 Hz扫描速率和256 x 256分辨率用于在90μmx 90μm扫描区域上获得形貌。测得的地形数据由图像处理和数据分析V2.1.15软件处理。在样本中比较了以下参数:平均粗糙度和最大峰谷距离。所有测试材料在精加工和抛光程序后均具有相似的平均表面粗糙度。最低值发生在材料Filtek Ultimate Body中,最高发生在Filtek Z550中。解释最大峰谷距离时,Filtek Z550,Filtek Z250和Filtek Ultimate Body出现了较大的值差异(最高100%),这是深抛光通道和轨迹的结果。填料的类型,大小,填料的分布以及填料在测试材料中的含量,不会影响平均粗糙度值,但会影响最大峰谷距离值。

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