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首页> 外文期刊>Diffusion and Defect Data. Solid State Data, Part A. Defect and Diffusion Forum >Effect of post-deposition annealing on some optical properties of thermally-evaporated V _2O _5 thin film
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Effect of post-deposition annealing on some optical properties of thermally-evaporated V _2O _5 thin film

机译:沉积后退火对热蒸发V _2O _5薄膜某些光学性能的影响

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摘要

A vanadium pentoxide sample with a film thickness of 75 nm has been thermally evaporated on unheated glass substrate using V _2O _5 high purity powder. The sample was subjected to a subsequent post-deposition annealing in air at different temperatures for a period of one hour. The optical properties were studied by transmittance and reflectance measurements. The integrated visible TVis, and solar, TSol, transmittance were calculated. The spectral behaviour of the refractive index as well as the absorption coefficient before and after post-deposition heat-treatment was also reported. X-ray diffraction confirmed that the film in the as-deposited as well as after annealing up to 400 °C is in the amorphous state.
机译:使用V _2O _5高纯粉末在不加热的玻璃基板上热蒸发了厚度为75 nm的五氧化二钒样品。样品在空气中在不同温度下进行随后的沉积后退火一小时。通过透射率和反射率测量来研究光学性质。计算了可见光的积分TVis和太阳透射率TSol。还报道了沉积后热处理前后折射率的光谱行为以及吸收系数。 X射线衍射证实在沉积时以及在高达400℃退火之后的膜处于非晶态。

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