首页> 外文期刊>Diffusion and Defect Data. Solid State Data, Part A. Defect and Diffusion Forum >Magnetoresistance and Thermoelectric Power of Semiconductors at Pressures up to 30 GPa
【24h】

Magnetoresistance and Thermoelectric Power of Semiconductors at Pressures up to 30 GPa

机译:压力高达30 GPa时半导体的磁阻和热电功率

获取原文
获取原文并翻译 | 示例
           

摘要

The results are observed of magnetoresistance and thermoelectric power measurements of crystalline, amorphous and defect semiconductors in pressure range 0 - 30 GPa. It is shown, that by using of the above techniques and also exploring the model of Peierls distortion of lattice it's possible to investigate the details of electron structure of materials undergoing pressure-induced phase transformations. The examples presented for chalcogens Te, Se and mercury chalcogenides HgX (X - Te, Se, S, O).
机译:在0-30 GPa的压力范围内,对晶体,非晶和缺陷半导体的磁阻和热电功率测量结果进行了观察。结果表明,利用上述技术并探索晶格的Peierls畸变模型,有可能研究经历压力诱导相变的材料的电子结构的细节。给出了硫属元素Te,Se和汞硫属元素化物HgX(X-Te,Se,S,O)的实例。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号