Critical disease components of common bacterial blight to effectively evaluate resistant genotypes of snap bean

摘要

Common bacterial blight (CBB) caused by pv. (Xap) is the main bacterial disease of snap bean. The present work aimed to select snap bean genotypes that are resistant to CBB based on three components of resistance: area under the disease progress curve, latent period, and lesion diameter on pods (DL). A completely randomized two-factor factorial design with six replications was used to evaluate leaves and pods of 14 snap bean and three common bean genotypes (PI 207262, BAC-6 and A-794) with high resistance to CBB. Two Xap isolates, 1394-98 and 775-90, were used to inoculate leaves and pods. Data were analyzed using nonparametric statistics. Significant differences were observed among the evaluated genotypes for all of the components of resistance, except for DL. The snap bean UENF 1482 demonstrated good performance in two disease resistance components. For this reason, this genotype can be recommended for use in breeding programs that aim to generate snap bean genotypes resistant to pv. .