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Chemical Failure Mode Addition to the Failure Mode Taxonomy

机译:化学故障模式添加到故障模式分类中

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摘要

The research objective of this article is to fortify the failure mode taxonomy by including chemical failures. This inclusion would enable comprehensive risk analysis in technology-based products. As technology improves at an exponential rate, partially owing to chemical advances in the semiconductor industry, failure identification tools must keep up with the pace. While the current version of the failure mode taxonomy does consider multiple domains of failure, it does not include a comprehensive collection of chemical failures. Therefore this taxonomy is insufficient for a large number of new products. The research presented here includes identifying chemical failures from publications in the semiconductor industry. These failures were then analyzed to determine the rudimentary failure modes in each case. Finally the newly identified failure modes were added to the failure mode taxonomy. A case study is presented to demonstrate using the updated failure mode taxonomy to identify both potential failures and product risks.
机译:本文的研究目标是通过包含化学故障来加强故障模式分类法。包括在内将能够对基于技术的产品进行全面的风险分析。随着技术以指数级的速度发展,部分是由于半导体行业的化学进步,故障识别工具必须跟上步伐。尽管当前版本的故障模式分类法确实考虑了多个故障域,但它不包括化学故障的全面集合。因此,这种分类法不足以用于大量新产品。本文介绍的研究包括从半导体行业的出版物中识别化学故障。然后分析这些故障,以确定每种情况下的基本故障模式。最后,将新识别的故障模式添加到故障模式分类中。提出了一个案例研究,以演示如何使用更新的故障模式分类法来识别潜在故障和产品风险。

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