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On the relation between thermally activated and magnetically stimulated processes during dislocation movement in InSb crystals in a magnetic field

机译:InSb晶体在磁场中位错运动过程中热活化过程和磁激发过程之间的关系

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It is shown that, in contrast to conventional mobility of dislocations in InSb crystals, which is characterized by a thermally activated temperature dependence of velocity (v proportional to exp(-U/kT), where U is the activation energy), relaxation displacements of dislocation in the same crystals in a magnetic field in the absence of external load are described by a more complex temperature dependence. The v(7-) dependence in the temperature range 120-250 degrees C studied here exhibits a tendency to linearization in the In v vs. 1/T coordinates only in its low-temperature part and rapidly attains saturation upon an increase in temperature. The observed decrease in the thermal sensitivity of relaxation mobility of dislocations in the magnetic field upon heating is interpreted in the framework of the model describing the detachment of a dislocation from a point defect as a sequence of two processes: (i) magnetically stimulated lowering of the barrier, U -> U (over time T,P of the spin evolution in the system) and (ii) expectation of thermal fluctuation (over a time T-th proportional to exp(U'/kT)). Thus, at low temperatures, we have tau(th) tau(sp), and the total time before detachment amounts to tau(th) + tau(sp) approximate to tau(th). On the contrary, at high temperatures, we have tau(th) tau(sp) and tau(th) + tau(sp) approximate to tau(sp) (i.e., the motion becomes athermal). It is shown that this model correctly describes the results of measurements and makes it possible to separate the effects. In particular, it is found that the barrier height decreases from the activation energy U = 0. 8 eV under a load of 10 MPa to V 0.25 eV in a magnetic field of B = 0.8 T.
机译:结果表明,与InSb晶体中位错的常规迁移率不同(其特征在于速度对速度的热激活温度依赖性(v与exp(-U / kT)成正比,其中U为激活能)),弛豫位移为在没有外部负载的情况下,磁场中同一晶体中的位错由更复杂的温度依赖性来描述。在此研究的120-250摄氏度温度范围内的v(7-)依赖性仅在其低温部分显示In v vs.1 / T坐标线性化的趋势,并且随着温度的升高迅速达到饱和。在模型的框架中解释了观测到的磁场中位错的弛豫迁移率对热敏感性的降低,该模型将位错与点缺陷的分离描述为两个过程的序列:(i)磁激发降低势垒,U→U(在系统中自旋演化的时间T,P上)和(ii)对热波动的期望(在与exp(U'/ kT)成正比的时间T上)。因此,在低温下,我们的tau(th) tau(sp),并且分离前的总时间为tau(th)+ tau(sp)近似于tau(th)。相反,在高温下,我们的tau(th) tau(sp)和tau(th)+ tau(sp)近似于tau(sp)(即,运动变为无热)。结果表明,该模型正确描述了测量结果,并可以分离效果。特别地,发现在B = 0.8 T的磁场中,势垒高度从10 MPa负载下的活化能U = 0. 8 eV降低到V 0.25 eV。

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