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首页> 外文期刊>Journal of Electronic Materials >Contact Resistance and Metallurgical Connections Between Silver Coated Polymer Particles in Isotropic Conductive Adhesives
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Contact Resistance and Metallurgical Connections Between Silver Coated Polymer Particles in Isotropic Conductive Adhesives

机译:各向同性导电胶中涂银聚合物颗粒之间的接触电阻和冶金学联系

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Recently, there has been an increasing interest in silver thin film coated polymer spheres as conductive fillers in isotropic conductive adhesives (ICAs). Such ICAs yield resistivities similar to conventional silver flake based ICAs while requiring only a fraction of the silver content. In this work, effects of the nanostructure of silver thin films on inter-particle contact resistance were investigated. The electrical resistivity of ICAs with similar particle content was shown to decrease with increasing coating thickness. Scanning electron micrographs of ion milled cross-sections revealed that the silver coatings formed continuous metallurgical connections at the contacts between the filler particles after adhesive curing at 150A degrees C. The electrical resistivity decreased for all samples after environmental treatment for 3 weeks at 85A degrees C/85% relative humidity. It was concluded that after the metallurgical connections formed, the bulk resistance of these ICAs were no longer dominated by the contact resistance, but by the geometry and nanostructure of the silver coatings. A figure of merit (FoM) was defined based on the ratio between bulk silver resistivity and the ICA resistivity, and this showed that although the resistivity was lowest in the ICAs containing the most silver, the volume of silver was more effectively used in the ICAs with intermediate silver contents. This was attributed to a size effect due to smaller grains in the thickest coating.
机译:最近,人们越来越关注银薄膜涂覆的聚合物球体,作为各向同性导电胶粘剂(ICAs)中的导电填料。这样的ICA产生的电阻率与传统的基于银薄片的ICA相似,而仅需少量的银。在这项工作中,研究了银薄膜的纳米结构对颗粒间接触电阻的影响。已显示具有相似颗粒含量的ICAs的电阻率随涂层厚度的增加而降低。离子铣削横截面的扫描电子显微镜照片显示,在150A摄氏度的粘合剂固化后,银涂层在填料颗粒之间的接触处形成了连续的冶金连接。在85A摄氏度的环境下处理3周后,所有样品的电阻率均降低相对湿度/ 85%。结论是,在形成冶金连接之后,这些ICA的体电阻不再由接触电阻决定,而是由银涂层的几何形状和纳米结构决定。根据体银电阻率与ICA电阻率之间的比率定义了品质因数(FoM),这表明尽管在含银量最高的ICA中电阻率最低,但在ICA中更有效地使用了银量银含量中等。这归因于最厚涂层中较小的晶粒,从而产生尺寸效应。

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