An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis

摘要

In this paper we propose an accurate methodology to diagnose cell internal defects, including defects caused by neighboured lines and defects caused by defective contacts. This methodology uses a precise intra-gate fault dictionary containing potential cell internal defects' signatures to determine with precision the cell internal defect that explain the failures observed on the tester. The proposed methodology gives accurate results since it is based on the use of physical information extracted from library cells' layout to create the intra-gate fault dictionary. Our method allows the diagnosis of cell internal defects in presence of different multiple fault configurations and volume data. Experiments are performed on industrial designs in which different types of multiple faults were injected with cell internal defects. The correct fault locations and causes are well predicted in all cases.