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首页> 外文期刊>Journal of Chromatographic Science >Tailing of Chromatographic Peaks in GC-MS Caused by Interaction of Halogenated Solvents with the Ion Source
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Tailing of Chromatographic Peaks in GC-MS Caused by Interaction of Halogenated Solvents with the Ion Source

机译:卤代溶剂与离子源相互作用引起的GC-MS色谱峰拖尾

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The injection of analytes into a gas chromatography- mass spectrometry (GC-MS) system using dichloromethane (DCM) as solvent led to gradual deterioration of chromatographic signals, with significant tailing and loss of sensitivity for C_(17+) hydrocarbons. The injector, gas chromatograph and transfer line were excluded as causes. Normal peak shape could only be restored by the insertion of a cleaned MS ion source. To elucidate potential surficial contaminants, the ion source was heated from 260 to 320℃, leading to the release of increasing concentrations of ferrous chloride [FeCI_2(g)]. The ferrous chloride probably formed through the decomposition of DCM on metal surfaces in the ion source. We posit that the tailing was caused by the adsorption of analytes to sub-μm layers of FeCI2 at crystal defect sites in the metal, followed by the slow release of molecules back into the gas phase. There are at least two other cases in the literature in which tailing is specifically associated with the use of halogenated solvents. However, it is possible that the problem is relatively common, albeit rarely diagnosed and reported. The tailing of chromatographic peaks caused by the formation of ferrous chloride in the mass spectrometer can be diagnosed by scanning the MS background signal for the diagnostic isotopic pattern of FeCI_2~+. The problem is easily solved by cleaning the MS ion source and avoiding halogenated solvents.
机译:将分析物注入使用二氯甲烷(DCM)作为溶剂的气相色谱-质谱(GC-MS)系统中会导致色谱信号逐渐变差,明显拖尾并降低C_(17+)烃的灵敏度。排除了进样器,气相色谱仪和传输线的原因。只有插入清洁的MS离子源才能恢复正常的峰形。为了阐明潜在的表面污染物,将离子源从260℃加热到320℃,从而释放出越来越高浓度的氯化亚铁[FeCl_2(g)]。氯化亚铁可能是由于DCM在离子源的金属表面上分解而形成的。我们认为,拖尾是由于分析物吸附到金属中晶体缺陷部位的亚微米FeCl2层上,然后分子缓慢释放回到气相中所致。文献中至少有另外两种情况,其中拖尾与卤化溶剂的使用特别相关。但是,尽管很少被诊断和报告,但该问题很可能相对普遍。质谱仪中氯化亚铁的形成所导致的色谱峰拖尾可以通过扫描MS背景信号中FeCl_2〜+的诊断同位素模式进行诊断。通过清洁MS离子源并避免使用卤化溶剂,可以轻松解决该问题。

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