...
【24h】

Application of a Genetic Algorithm Associated With Adhesive Joint Analysis to the IC Chip Pick-up Process

机译:遗传算法与胶接分析相结合在IC芯片拾取过程中的应用

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

In the condition investigated here, a concentrated force is applied to both IC chip and blue tape bonded by an adhesive under pin-pin boundary conditions. The experimental results show that even though IC chips of 0.1 mm thickness are subjected to a concentrated force of 4.8 N, they cannot be fully separated from the blue tape and fail easily during the pick-up process. However, when IC chips of 0.34 mm thickness are subjected to a concentrated force of only 3.5 N, they can be fully separated from the blue tape without breakage. These two experimental findings are then explored analytically by applying the C++ program of the genetic algorithm associated with adhesively bonded joint analysis to the IC chip pick-up process. In accordance with the experimental results, the results for the 0.1 mm thick IC chips reveal no solutions for the material properties or adhesive thickness to satisfy the conditions of the IC chip successful pick-up process, although those for the 034 mm thick IC chips show solutions for the values of both the elastic modulus and the adhesive layer's thickness. As regards the easy failure of IC chips with 0.1 mm thickness, if the blue tape's mechanical properties are appropriately chosen and then used in this process and its elastic modulus is greater than one-tenth that of the IC chips, the probability of the IC chips being fully separated from the blue tape can be expected to increase.
机译:在这里研究的条件下,在引脚-引脚边界条件下,将集中力施加到通过粘合剂粘合的IC芯片和蓝色胶带上。实验结果表明,即使厚度为0.1 mm的IC芯片受到4.8 N的集中力,它们也无法与蓝带完全分离,并且在拾取过程中很容易失效。但是,当0.34 mm厚度的IC芯片仅受到3.5 N的集中力时,它们就可以与蓝带完全分离而不会断裂。然后,通过将遗传算法的C ++程序与粘合键合分析相关联地应用于IC芯片拾取过程,来分析性地探索这两个实验结果。根据实验结果,尽管厚度为034 mm的IC芯片的结果显示,厚度为0.1 mm的IC芯片的结果表明,没有解决材料特性或粘合剂厚度的解决方案来满足IC芯片成功拾取过程的条件。弹性模量和粘合层厚度值的解。对于厚度为0.1 mm的IC芯片容易失效的问题,如果适当选择蓝色胶带的机械性能,然后在该过程中使用它,并且其弹性模量大于IC芯片的十分之一,则出现IC芯片的可能性与蓝色胶带完全分开的情况可能会增加。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号