Micro/Nano-particle Manipulation and Adhesion Studies

摘要

In this paper recent progress in microano-particle manipulation and particle-substrate adhesion studies is reviewed.Various particle manipulation and particle-substrate adhesion measurement techniques are summarized.An atomic force microscope(AFM)is the most commonly used tool for particle manipulation,and there are also some custom-made devices that employ different interactions such as van der Waals,electrostatic and capillary forces to manipulate microano-particles.In particle-substrate adhesion study,the contact-based measurement techniques such as pull-off test and lateral push test explore the adhesion between a single particle and a substrate,while non-contact adhesion measurement techniques such as electric field detachment and centrifugal detachment methods simultaneously explore the adhesion properties of a group of particles.Also reviewed are recent studies on factors that affect the particle-substrate adhesion,including surface roughness,electrostatic charge and relative humidity.