首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Investigations of interfacial reactions of Sn-Zn based and Sn-Ag-Cu lead-free solder alloys as replacement for Sn-Pb solder
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Investigations of interfacial reactions of Sn-Zn based and Sn-Ag-Cu lead-free solder alloys as replacement for Sn-Pb solder

机译:Sn-Zn基和Sn-Ag-Cu无铅焊料合金替代Sn-Pb焊料的界面反应的研究

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摘要

The interfacial reactions of Sn-Zn based solders and a Sn-Ag-Cu solder have been compared with a eutectic Sn-Pb solder. During reflow soldering different types of intermetallic compounds (IMCs) are found at the interface. The morphologies of these IMCs are quite different for different solder compositions. As-reflowed, the growth rates of IMCs in the Sn-Zn based solder are higher than in the Sn-Ag-Cu and Sn-Pb solders. Different types of IMCs such as gamma-Cu_5Zn_8, beta-CuZn and a thin unknown Cu-Zn layer are formed in the Sn-Zn based solder but in the cases of Cu/Sn-Pb and Cu/Sn-Ag-Cu solder systems Cu_6Sn_5 IMC layers are formed at the interface. Cu_6Sn_5 and Cu_3Sn interfacial IMCs are formed in the early stages of 10min reflow due to the limited supply of Sn from the Sn-Pb solder. The spalling of Cu-Sn IMCs is observed only in the Sn-Ag-Cu solder. The size of Zn platelets is increased with an increase of reflow time for the Cu/Sn-Zn solder system. In the case of the Sn-Zn-Bi solder, there is no significant increase in the Zn-rich phases with extended reflow time. Also, Bi offers significant effects on the wetting, the growth rate of IMCs as well as on the size and distribution of Zn-rich phases in the beta-Sn matrix. No Cu-Sn IMCs are found in the Sn-Zn based solder during 20 min reflow. The consumption of Cu by the solders are ranked as Sn-Zn-Bi > Sn-Ag-Cu > Sn-Zn > Sn-Pb. Despite the higher Cu-consumption rate, Bi-containing solder may be a promising candidate for a lead-free solder in modem electronic packaging taking into account its lower soldering temperature and material costs.
机译:已将Sn-Zn基焊料和Sn-Ag-Cu焊料与共晶Sn-Pb焊料的界面反应进行了比较。在回流焊接期间,在界面处发现了不同类型的金属间化合物(IMC)。对于不同的焊料成分,这些IMC的形态非常不同。回流后,基于Sn-Zn的焊料中IMC的生长速率高于Sn-Ag-Cu和Sn-Pb焊料中的IMC的生长速率。在Sn-Zn基焊料中形成了不同类型的IMC,例如γ-Cu_5Zn_8,β-CuZn和未知的薄Cu-Zn层,但在Cu / Sn-Pb和Cu / Sn-Ag-Cu焊料系统中在界面处形成Cu_6Sn_5 IMC层。由于Sn-Pb焊料中Sn的供应有限,因此在10min回流的早期就形成了Cu_6Sn_5和Cu_3Sn界面IMC。仅在Sn-Ag-Cu焊料中观察到了Cu-Sn IMC的剥落。 Zn薄片的尺寸随着Cu / Sn-Zn焊料系统回流时间的增加而增加。对于Sn-Zn-Bi焊料,随着回流时间的延长,富含Zn的相没有明显增加。此外,Bi对IMC的润湿,IMC的生长速率以及β-Sn基质中富锌相的大小和分布都具有显着影响。回流20分钟后,在Sn-Zn基焊料中未发现Cu-Sn IMC。焊料消耗的铜的等级为:Sn-Zn-Bi> Sn-Ag-Cu> Sn-Zn> Sn-Pb。尽管较高的Cu消耗速率,但考虑到较低的焊接温度和材料成本,含Bi的焊料可能是现代电子包装中无铅焊料的有希望的候选者。

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