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Preparation and characterisation of electrodeposited Ni-Cu/Cu multilayers

机译:电沉积Ni-Cu / Cu多层膜的制备与表征

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Ni-Cu/Cu multilayers have been, grown from a single electrolyte under potentiostatic conditions at different electrolyte pH values. The current-time transients recorded during deposition indicated different growth modes of the Ni-Cu layers. Structural characterisation by X-ray diffraction revealed that the multilayers have the same crystal structure and texture as their ( 1 0 0) textured polycrystalline Cu substrate. Scanning electron microscopy showed that the films grown at low pH (2.2) have smoother surfaces than those grown at high pH (3.0). Energy dispersive X-ray analysis revealed that the magnetic layers of the multilayers electrodeposited at high pH contain much more Cu compared to those deposited at low pH. Anisotropic magnetoresistance was found for nominal Cu layer thicknesses below 0.6 nm, and giant magnetoresistance (GMR) above 0.6 nm. The shape of the magnetoresistance curves for GMR multilayers indicated the predominance of a superparamagnetic contribution, possibly due to the discontinuous nature of the magnetic layer. For multilayers with the same bilayer and total thicknesses, the GMR magnitude decreased as the electrolyte pH increased. Besides possible structural differences, this may have come from a strong increase in the Cu content of the magnetic layers since this causes a nearly complete loss of ferromagnetism at room temperature.
机译:Ni-Cu / Cu多层膜是由单一电解质在恒电位条件下,在不同的电解质pH值下生长而成的。沉积期间记录的当前时间瞬变表明Ni-Cu层的不同生长模式。通过X射线衍射的结构表征表明,多层具有与其(1 0 0)织构化的多晶Cu衬底相同的晶体结构和织构。扫描电子显微镜显示,与在高pH(3.0)下生长的膜相比,在低pH(2.2)下生长的膜具有光滑的表面。能量色散X射线分析表明,与在低pH下沉积的那些相比,在高pH下电沉积的多层的磁性层包含更多的Cu。对于低于0.6 nm的标称Cu层厚度和高于0.6 nm的巨磁阻(GMR),发现了各向异性的磁阻。 GMR多层的磁阻曲线的形状表明,超顺磁贡献占主导地位,这可能是由于磁性层的不连续性所致。对于具有相同双层和总厚度的多层,随着电解质pH值的增加,GMR值会降低。除了可能的结构差异外,这可能还来自磁性层中Cu含量的强烈增加,因为这会导致室温下铁磁性几乎完全丧失。

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