Development of powder diffraction apparatus for small-angle X-ray scattering measurements

摘要

A novel type of X-ray collimation system attached to commercial powder diffractometers makes the structural characterization of nanomaterials possible in a wide size range from <0.1 to 100 nm by combination of the small- and wide-angle X-ray scattering techniques. There is no dead interval in the detection between the small- and wide-angle regimes. This device can be attached to any existing 'θ/θ' powder diffractometer, providing a multi-functional small- and wide-angle X-ray scattering/diffraction (SWAXS) apparatus. After proper alignment and adjustment, the device can be removed and re-attached at any time to switch between normal and SWAXS functions.