首页> 外国专利> INTENSITY AMPLIFICATION DEVICE IN TRANSMISSION TYPE SMALL-ANGLE X-RAY SCATTERING (TSAXS) MEASUREMENT

INTENSITY AMPLIFICATION DEVICE IN TRANSMISSION TYPE SMALL-ANGLE X-RAY SCATTERING (TSAXS) MEASUREMENT

机译:透射型小角度X射线散射(TSAXS)测量中的强度放大装置

摘要

PROBLEM TO BE SOLVED: To provide a device for amplifying the scattering intensity from a target object in X-ray scattering measurement, to improve the speed and signal quality by amplification of X-ray scattering, and to facilitate the measurement of the critical dimension of the pitch and the analysis of the shape and variation when HVM is performed.;SOLUTION: The present disclosure provides a device for amplifying the scattering intensity in tSAXS measurement. The device includes an enhancement lattice object and an arrangement mechanism. The enhancement lattice object is positioned in a longitudinal coherence length of incident X-rays from a target object. The arrangement mechanism can arrange the enhancement lattice object with respect to the target object at a nanometer accuracy in both of the lateral direction and longitudinal direction.;COPYRIGHT: (C)2015,JPO&INPIT
机译:要解决的问题:提供一种在X射线散射测量中放大目标物体的散射强度的设备,通过放大X射线散射来提高速度和信号质量,并有助于测量物体的临界尺寸。解决方案:本公开提供了一种用于在tSAXS测量中放大散射强度的装置。该装置包括增强晶格物体和布置机构。增强晶格物体位于来自目标物体的入射X射线的纵向相干长度中。该布置机构可以在横向和纵向两个方向上以纳米精度相对于目标物体布置增强晶格物体。;版权所有:(C)2015,JPO&INPIT

著录项

  • 公开/公告号JP2015078988A

    专利类型

  • 公开/公告日2015-04-23

    原文格式PDF

  • 申请/专利权人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE;

    申请/专利号JP20140211199

  • 发明设计人 FU WEI-EN;WU WEN-LI;

    申请日2014-10-15

  • 分类号G01N23/20;G01B15;

  • 国家 JP

  • 入库时间 2022-08-21 15:33:30

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