首页> 外国专利> Apparatus for amplifying intensity during transmission small angle X-ray scattering measurements

Apparatus for amplifying intensity during transmission small angle X-ray scattering measurements

机译:在透射小角度X射线散射测量期间放大强度的装置

摘要

The disclosure provides an apparatus for amplifying scattering intensity during tSAXS measurements. The apparatus includes an enhancement grating object (14) and a placement mechanism. The enhancement grating object is positioned within a longitudinal coherence length of an incident X-ray from a target object (12). The placement mechanism is capable of placing the enhancement grating object with nanometer precision with respect to the target object in both a lateral and a longitudinal directions.
机译:本公开提供了一种用于在tSAXS测量期间放大散射强度的设备。该设备包括增强光栅物体(14)和放置机构。增强光栅物体位于从目标物体(12)入射的X射线的纵向相干长度内。放置机构能够相对于目标物体在横向和纵向上以纳米精度放置增强光栅物体。

著录项

  • 公开/公告号EP2863213B1

    专利类型

  • 公开/公告日2019-11-27

    原文格式PDF

  • 申请/专利权人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE;

    申请/专利号EP20140188777

  • 发明设计人 FU WEI-EN;WU WEN-LI;

    申请日2014-10-14

  • 分类号G01N23/201;

  • 国家 EP

  • 入库时间 2022-08-21 11:41:13

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号