Comments on 'On the reliability of fully automatic indexing of electron diffraction patterns obtained in a transmission electron microscope' by Morawiec & Bouzy (2006)

摘要

The limitation of automatic indexing of electron diffraction patterns raised by Morawiec & Bouzy [(2006). J. Appl. Cryst.39, 101-103] is discussed. The theoretical problem related to the famous 180 degrees ambiguity may be surmounted by adequate technical improvements. Three solutions to avoid misindexing are briefly described.