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首页> 外文期刊>Journal of analytical chemistry >The formation of analytical and background signals in radioisotope x-ray fluorescence analysis using a Am-241 radioactive source and a Si(Li) detector
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The formation of analytical and background signals in radioisotope x-ray fluorescence analysis using a Am-241 radioactive source and a Si(Li) detector

机译:使用Am-241放射源和Si(Li)检测器在放射性同位素X射线荧光分析中形成分析和背景信号

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摘要

Reasons for the appearance of a background signal in the relatively soft x-ray range (2-15 keV) upon fluorescence excitation with the Am-241 radioisotope are discussed. Mathematical models are proposed for the interaction of the radiation of the radioactive source with the sample and the Si(Li) detector, capable of describing the appearance of the analytical and background signals. It was shown that processes occurring in the Si(Li) detector should be taken into account to explain and calculate the background signal in this range. The results of calculations agree well with the experimental data obtained using an Am-241 radiation source for fluorescence excitation.
机译:讨论了用Am-241放射性同位素激发荧光后在相对较软的X射线范围(2-15 keV)出现背景信号的原因。提出了用于描述放射源与样品和Si(Li)检测器的相互作用的数学模型,该模型能够描述分析信号和背景信号的出现。结果表明,应该考虑在Si(Li)检测器中发生的过程来解释和计算该范围内的背景信号。计算结果与使用Am-241辐射源进行荧光激发获得的实验数据非常吻合。

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