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Cross-sectional TEM study of unepitaxial crystallites in a homoepitaxial diamond film

机译:同质外延金刚石膜中非外延微晶的截面TEM研究

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We investigated the structure of unepitaxial crystallites (UC; non-epitaxial crystallites) in homepitaxial diamond films on Ib (001) diamond substrate grown by the chemical vapor deposition (CVD), employing field emission scanning electron microscopy (FE-SEM) and high-resolution transmission electron microscopy (HRTEM) The UC was classified into two types depending on the orientation relationship to the homoepitaxial film; one rotates by 70.5deg around the common <110>axis, corresponding to #SIGMA#3 coincidence site lattice (CSL) relation. The other type does not have any particular angular relationship. It was found that the growth of the former type is closely related to a lattice dislocation on the substrate surface as well as the homoepitaxial film. On the other hand, there was hardly any lattice dislocation observed at the bottom of the latter type. A nanometer-sized crystalline diamond particle was observed at the nucleation site of the latter one.
机译:我们采用场发射扫描电子显微镜(FE-SEM)和高光谱技术研究了通过化学气相沉积(CVD)生长的Ib(001)金刚石基底上的同质外延金刚石膜中的非异相微晶体(UC;非外延微晶)结构。分辨率透射电镜(HRTEM)根据与同质外延膜的取向关系,UC分为两种类型。一个绕着共同的<110>轴旋转70.5度,对应于#SIGMA#3重合点阵(CSL)关系。另一种类型没有任何特定的角度关系。发现前一种类型的生长与衬底表面以及同质外延膜上的晶格位错密切相关。另一方面,在后一种类型的底部几乎没有观察到晶格位错。在后一个的成核位置观察到纳米级的结晶金刚石颗粒。

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