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High-resolution electron energy-loss spectroscopy of undoped and nitrogen-doped tetrahedral amorphous carbon films

机译:未掺杂和氮掺杂的四面体非晶碳膜的高分辨率电子能量损失谱

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摘要

Undoped and nitrogen-doped amorphous carbon (ta-C) films deposited using a filtered cathodic vacuum arc were investigated by high-resolution electron energy-loss spectroscopy in transmission. The carbon and nitrogen K-edge spectra show fine structure at the C 1s to π{sup}* excitations which gives information about the hybridization and coordination of the carbon and nitrogen atoms. The loss data were collected up to 50 eV and a Kramers-Kronig analysis was used to derive their complex dielectric functions. The ε{sub}2 spectra show two features due to excitations of π and σ valence states. The π feature is very small in ta-C deposited at 100 eV, consistent with its high sp{sup}3 content. The development of the π and σ peaks with varying sp{sup}2 content and their oscillator strengths allow us to resolve the degree of π-σ mixing which arises from disorder in more sp{sup}3-bonded carbons.
机译:通过高分辨率的电子能量损失谱研究了透射中使用过滤的阴极真空电弧沉积的未掺杂和氮掺杂的非晶碳(ta-C)膜。碳和氮的K边缘光谱在C 1s到π{sup} *激发下显示出良好的结构,从而提供了有关碳和氮原子的杂化和配位的信息。收集高达50 eV的损耗数据,并使用Kramers-Kronig分析得出其复数介电函数。 ε{sub} 2光谱由于激发了π和σ价态而表现出两个特征。 π特征在100 eV处沉积的ta-C很小,与其高sp {sup} 3含量相符。随着sp {sup} 2含量的变化而产生的π和σ峰及其振子强度使我们能够解决由更多sp {sup} 3键合碳中的无序性引起的π-σ混合程度。

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