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ELECTRONIC PROPERTIES OF UNDOPED AND DOPED TETRAHEDRAL AMORPHOUS CARBON

机译:未掺杂和掺杂四面体无定形碳的电子性质

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Recent experimental studies on the electronic properties of thin films of tetrahedrally bonded amorphous carbon (ta-C) are reviewed. These films were grown either by vacuum arc deposition or by mass selected ion beam deposition. In several papers it was stated that ta-C is a p-type semiconductor. I will show that the given experimental evidence for p-type conductivity in ta-C is rather weak. Our studies show that doping of ta-C with B, N and P significantly influences the electrical conductivity. No evidence for p-type or n-type doping was found. In all cases, electrical conduction is due to hopping conduction and at high electric fields due to Frenkel-Poole conduction. This is shown with I-V measurements in metal/ta-C/metal structures, diode-like layered ta-C structures and ta-C/Si heterojunctions.
机译:回顾了最近对薄膜薄膜电子性质的实验研究进行了综述。这些薄膜通过真空弧沉积或质量选择的离子束沉积而生长。在几篇论文中,表示TA-C是P型半导体。我会表明,在TA-C中的P型电导率的给定实验证据相当弱。我们的研究表明,具有B,N和P的TA-C掺杂显着影响电导率。没有发现p型或n型掺杂的证据。在所有情况下,导电导致由于Frenkel-Poole传导,由于跳跃导通和高电场。这在金属/ TA-C /金属结构中具有I-V测量,二极管状层状TA-C结构和TA-C / Si异质结。

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