...
首页> 外文期刊>Diamond and Related Materials >Epitaxial Ir layers on SrTiO{sub}3 as substrates for diamond nucleation: deposition of the films and modification in the CVD environment
【24h】

Epitaxial Ir layers on SrTiO{sub}3 as substrates for diamond nucleation: deposition of the films and modification in the CVD environment

机译:SrTiO {sub} 3上的外延Ir层作为金刚石成核的基质:膜的沉积和在CVD环境中的改性

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

Iridium films on SrTiO{sub}3(001) have recently proven to be a superior substrate material for the heteroepitaxy of diamond thin films by chemical vapour deposition in the effort towards the realization of single crystal diamond films. In this paper we report on the growth and structural properties of iridium (Ir) films deposited by electron-beam evaporation on SrTiO{sub}3(00l) surfaces varying the deposition temperature between 280 and 950℃. The films were studied by scanning electron microscopy, atomic force microscopy and X-ray diffraction. At the highest temperature film growth proceeds via three-dimensional nucleation, coalescence and subsequent layer-by-layer growth. The resulting films show a cube-on-cube orientation relationship with the substrate and a minimum mosaic spread of 0.15°. Towards lower deposition temperatures the orientation spread increases only slightly down to ~500℃ while the surface roughness, after passing through a maximum at ~860℃, decreases significantly. For the lowest temperatures (below 500℃) the mosaic spread rises accompanied by the occurrence of twins until the epitaxial order is lost. Plasma treatment in the diamond deposition reactor at high temperature (920℃) yields low nucleation densities and modifies the Tr surface. At the same time {111} facets show a significantly higher structural stability as compared with {001} facets. Nucleation at 700℃ results in highly aligned diamond grains with low mosaic spread and a vanishing fraction of randomly oriented grains, proving the superior properties of Ir films on SrTiO{sub}3 for diamond nucleation as compared with pure silicon substrates.
机译:最近,SrTiO {sub} 3(001)上的铱膜已被证明是通过化学气相沉积法实现金刚石薄膜异质外延的一种优良基材,以实现单晶金刚石膜。本文报道了电子束蒸发沉积在280至950℃之间的SrTiO {sub} 3(00l)表面上的电子束蒸发沉积的铱(Ir)膜的生长和结构特性。通过扫描电子显微镜,原子力显微镜和X射线衍射研究薄膜。在最高温度下,膜的生长通过三维成核,聚结和随后的逐层生长来进行。所得的膜与基材之间具有立方体对立方体的取向关系,最小马赛克扩散为0.15°。在较低的沉积温度下,取向扩散仅略微降低至〜500℃,而表面粗糙度在〜860℃达到最大值后显着降低。在最低温度(低于500℃)下,镶嵌扩散会增加,并伴有孪晶的出现,直到失去外延顺序。在高温(920℃)下在金刚石沉积反应器中进行等离子体处理会产生较低的成核密度,并修饰Tr表面。同时,{111}面比{001}面具有更高的结构稳定性。 700℃下的晶核形成高度取向的金刚石晶粒,马赛克分布低,并且随机取向的晶粒消失,这证明了SrTiO {sub} 3上的Ir膜具有比纯硅衬底优越的金刚石成核性能。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号