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Effectiveness of a hot-filament chemical vapor deposition method for preparation of a boron-doped superconducting diamond film with higher superconducting transition temperature

机译:热丝化学气相沉积法制备具有更高超导转变温度的掺硼超导金刚石薄膜的有效性

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We have investigated the effectiveness of a hot-filament chemical vapor deposition (HFCVD) method for preparation of a boron-doped superconducting diamond film with higher superconducting transition temperature (T_c). A boron-doped superconducting diamond film has been fabricated on a diamond (111) substrate using the HFCVD method, and studied by means of scanning electron microscopy, X-ray photoelectron spectroscopy (XPS), and resistivity. The film consists of grains with an average size of 200 mm. Analyses of valence band and boron Is core-level XPS spectra indicate the formation of boron-doped diamond film on the substrate. From the resistivity measurements, the film is found to be a superconductor with onset T_c of 7.1 K. Carrier concentration determined by Hall conductivity measurements is 1.1 x 10~(21) cm~(-3). The value of T_c is higher compared with that in boron-doped superconducting diamond films prepared by a commonly used microwave plasma-assisted chemical vapor deposition (MPCVD) method, at the same carrier concentration (A. Kawano et al., Phys. Rev. B 82 (2010) 085318]. The result of higher T_c in the film by the HFCVD method is consistent with the previous one [Wang et al., Diamond Relat. Mater. 15 (2006) 659], suggesting that the HFCVD method is effective for preparation of boron-doped superconducting diamond films showing higher T_c.
机译:我们已经研究了热丝化学气相沉积(HFCVD)方法制备具有更高超导转变温度(T_c)的掺硼超导金刚石薄膜的有效性。已使用HFCVD方法在金刚石(111)基板上制作了掺硼超导金刚石薄膜,并通过扫描电子显微镜,X射线光电子能谱(XPS)和电阻率进行了研究。薄膜由平均尺寸为200毫米的颗粒组成。价带和硼的分析核心级XPS光谱表明在基底上形成了掺硼金刚石薄膜。通过电阻率测量,发现该膜是超导体,其起始T_c为7.1K。通过霍尔电导率测量确定的载流子浓度为1.1 x 10〜(21)cm〜(-3)。与在相同载流子浓度下通过常用的微波等离子体辅助化学气相沉积(MPCVD)方法制备的掺硼超导金刚石薄膜相比,T_c值更高(A. Kawano等人,Phys.Rev。 B 82(2010)085318]。通过HFCVD方法得到的更高的T_c结果与先前的方法一致[Wang等,Diamond Relat。Mater。15(2006)659],这表明HFCVD方法是对于制备显示更高T_c的掺硼超导金刚石薄膜有效。

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