Automatic 3-temperature quality control of ASIC

摘要

The article presents the developed low-cost ASIC tester and the handler, a System that supplies the tester with the elements to be tested and is an indispensable part of the auto-matic test line. The cost reduction can be achieved by compromise with some of the parameters such as the number of Channels, the highest pattern fre-quency, voltage and current ranges. However, the basic functional parameters as precision and accur-acy, repeatability, short test time, self-calibration, etc. should be main-tained.