首页> 外文期刊>Vacuum: Technology Applications & Ion Physics: The International Journal & Abstracting Service for Vacuum Science & Technology >Effects of screen-grid bias voltage on the microstructure and properties of the ultrahigh molecular weight polyethylene (UHMWPE) modified by oxygen plasma
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Effects of screen-grid bias voltage on the microstructure and properties of the ultrahigh molecular weight polyethylene (UHMWPE) modified by oxygen plasma

机译:屏栅偏压对氧等离子体改性超高分子量聚乙烯(UHMWPE)微观结构和性能的影响

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摘要

The specimens of ultrahigh molecular weight polyethylene (UHMWPE) were treated by oxygen plasma using a pulse-biased screen-grid technique under different negative bias conditions. The screen-grid was used to provide an electric field to accelerate the oxygen ions towards the UHMWPE substrate during the plasma treatment process. The effects of the screen-grid voltage on the surface microstructure, wettability, mechanical properties and wear resistance of UHMWPE were investigated. It was found that the degree of crosslinking, oxidation, wettability and surface roughness of UHMWPE can be increased with the increasing of the screen-grid voltage. Owing to the increase of the degree of crosslinking, the hardened layer formed on the surface of the UHMWPE samples was also strengthened greatly with the increase of the grid voltage. However, the wear results indicated that the UHMWPE sample modified at higher bias voltage exhibits poor wear performance, which could be mainly related to the embrittlement resulted from the aggravation of oxidation.
机译:在不同的负偏压条件下,采用脉冲偏压筛网技术,通过氧等离子体对超高分子量聚乙烯(UHMWPE)样品进行处理。屏蔽栅用于提供电场,以在等离子处理过程中将氧离子加速朝UHMWPE基板移动。研究了栅网电压对超高分子量聚乙烯表面微观结构,润湿性,力学性能和耐磨性的影响。发现随着筛网电压的增加,UHMWPE的交联度,氧化度,润湿性和表面粗糙度可以增加。由于交联度的增加,UHMWPE样品表面形成的硬化层也随着栅极电压的增加而大大增强。然而,磨损结果表明,在较高偏压下改性的UHMWPE样品表现出较差的磨损性能,这可能与氧化加剧导致的脆化有关。

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